The ANSI C119 committee for testing electrical connectors is developing a new standard, ANSI C119.7, specifically for testing connectors used with high-temperature, low-sag (HTLS) conductors. Testing connectors used with HTLS conductors presents several challenges not found with connectors used for more common conductors that operate at temperatures typically below 100 °C. In the ANSI C119.4 standard, temperature used as an ‘accelerating factor’ to increase the aging rate is typically above the conductor’s maximum operating temperature. Consequently, another accelerating factor is needed.
In conjunction with the ANSI C119.7 committee, NEETRAC designed experiments that provided the committee with the information needed to determine the tension parameters, tensioning scheme, and tension level, for the standard.
This report includes the experimental setup, results, and commentary on each experimental sample set.
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